Langer - Near Field Probe Set RF2

The RF2 probe set contains magnetic field probes for pre-compliance tests of printed circuit boards. Measuring the magnetic fields in the area of the module, conducting tracks, components and the modules of the supply system is the basis for selective measures to reduce disturbance emissions.


The passive probes are connected to the 50 Ohm input of a spectrum analyzer or oscilloscope and allow comparative measurements of magnetic fields and disturbance currents in the frequency range from 30 MHz to 3 GHz. All probes have an sheath current damping and are electrically screened.

Contents:

  • H-Field Probe RF-R 400 - 1
  • H-Field Probe RF-R 50 - 1
  • H-Field Probe RF-U 5 - 2
  • H-Field Probe RF-B 3 - 2
  • Cable SMB-BNC
  • Case 175 x 140 x 32 mm
  • Instructions


 
Type Description Characteristic

RF-R 400 - 1
On account of its large diameter (25 mm) the near field probe is the most sensitive and therefore has the lowest resolution.
The probe can be used up to a distance of 10 cm from units. The detected field distribution enables the localization of HF magnetic field sources and deduction with regards to interference.
Ø approx. 25 mm

RF-R 50 - 1
The near field probe has a higher resolution and a lower sensitivity than the R 400-1.
It is suitable for measurements up to 3 cm. Interference sources can be localized by detecting the distribution and orientation of the field, therefore enabling a more exact use of higher resolution probes (RF 1 set). Ø approx. 10 mm

RF-U 5 - 2
The near field probe is designed for detecting surface and circular magnetic fields on very wide conducting paths, metallized surfaces, plug and socket connectors,electronic components, cablesandcomponent connections. The sources of HF magnetic fields can be detected and conclusions regarding internal interference currents achieved.
Resolution approx. 5 mm

RF-B 3 - 2
The near field probe is designed for the detection of magnetic fields which are emitted vertically from the surface area of flat units. The probe enables measurement of obstructed parts of the printed-circuit board. It is not possible to conduct measurements of field orientation such as can be done with the RF-R 3 - 2 probe.
Resolution approx. 2 mm

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