Langer - Near Field Probe Set RF 1
The RF1 &
RF2 probe set
contains magnetic field probes and an E-field probe for pre-compliance tests of
printed circuit boards. Measuring the magnetic fields in the area of the module,
conducting tracks, components and the modules of the supply system is the basis
for selective measures to reduce disturbance emissions.
The passive probes are
connected to the 50 Ohm input of a spectrum analyzer or oscilloscope and allow
comparative measurements of magnetic fields and disturbance currents in the
frequency range from 30 MHz to 3 GHz. All probes have an sheath current damping
and are electrically screened.
Contents:
- H-Field probe RF-R 3 - 2
- H-Field probe RF-U 2,5 - 2
- H-Field probe RF-K 7 - 4
- E-Field probe RF-E 10
- Cable SMB-BNC
- Case 175 x 140 x 32 mm
- Instructions
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| Type |
Description |
Characteristic |
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RF-R 3 - 2
The near field probe is designed to achieve nearly punctiform detection of HF magnetic fields. The size of the probe enables the resolution of magnetic field distribution within millimetres. Field orientation and distribution can be detected by moving the probe across larger areas or partially between conducting paths, within IC pin areas, bypass capacitors, EMC components, etc.
Resolution approx. 1 mm |
 |
 |
RF-U 2,5 - 2
The near field probe is designed for selective detection of the current spectrum in singular small conducting paths and component connections, capacitors, IC pins. The probe head contains a magnetically active curb with a width of approx. 0,5 mm. To achieve measurement the probe with the curb is positioned on conducting paths, IC or capacitor connections.
Resolution approx. 0,5 mm |
 |
 |
RF-K 7 - 4
The near field probe detects contra-orientated magnetic fields within the two halves of the probe's head; these can be the circular magnetic fields of larger objects such as IC substrates and wide conducting paths. The effect of homogeneous fields is sufficiently compensated for by the probe's special head. The probe is especially suitable for detecting the non-homogeneous fringe magnetic field of flat units.
Resolution approx. 5 mm |
 |
 |
RF-E 10
The near field probe detects electrical fields that clocked leads emit via their surface. The probe head tip is only approx. 0.5 mm wide. The integrated screening prevents interference to the measurement result from neighbouring leads. A resolution of approx. 0.2 mm is possible so that each individual track can be evaluated in the Layout.
Resolution approx. 0,2 mm |
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